Scientists are seeking corn leaf samples as they work to determine the cause of a new disease showing symptoms similar to Phaeosphaeria leaf spot.
Researchers are investigating an emerging leaf spot problem affecting corn in New York after similar symptoms were detected in Michigan.
Michigan State University researchers have reported affected fields in approximately 14 counties, with lesions showing characteristics that have previously been linked to Phaeosphaeria leaf spot.
The exact cause of the disease remains unknown. A fungus has been repeatedly detected in samples collected from symptomatic Michigan plants, including dark structures that allow the organism to survive in leaf tissue.
However, researchers emphasize that finding the fungus does not establish it as the source of the disease. Further laboratory testing is being conducted to identify the responsible organism.
New York corn growers who notice comparable symptoms are encouraged to report suspected cases. Photos of affected leaves and fields, along with the town and county, can help researchers track the issue. Information on corn hybrids, disease severity, and recent fungicide use is also valuable.
Researchers are requesting representative leaf samples because visual inspections alone may not provide reliable diagnoses. Cornell field crops pathologist Camilo H. Parada Rojas is coordinating reports and sample submissions.
For more information, contact Rojas at cp738@cornell.edu or +1 (919) 602-9841.
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