The soy checkoff recently honored an individual whose research results can be found in soybean fields across the United States.
The checkoff presented its Excellence in Production Research Award to Brian Diers, Ph.D., professor and associate head of the Crop Sciences Department at the University of Illinois.
“I’m honored to be chosen for the award,” Diers says. “It’s great to have this recognition back from the industry saying that what I’ve been doing is appreciated.”
The checkoff proudly recognizes individuals, organizations or companies whose achievements make positive impacts on the U.S. soybean industry or the soy checkoff.
Diers has been making an impact for more than 20 years, and his prolific work on subjects ranging from aphids to soybean cyst nematode has been published in 76 referred journal articles.
In addition to leading a large and diverse soybean breeding and genetics program at the University of Illinois, Diers leads a multi-institutional project to identify genes that control soybean yield and compositional traits.